Web2 sep. 2024 · Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful tool for surface analysis, but fragmentation of molecular species during the SIMS process may lead to complex mass spectra. Web10 apr. 2024 · Integration of p-type doped poly-Si (p + poly-Si) on the other hand remains more challenging. One of the reasons is that p + poly-Si generally provides lower passivation quality as compared to n + poly-Si. This lower passivation quality is thought to be related to boron more easily diffusing through the poly-Si layer (compared to …
IONTOF - TOF-SIMS (time of flight secondary ion mass …
Web13 mei 2024 · ToF-SIMS can be used for surface analysis of elements and molecules and for getting in-depth sample information. It offers lateral imaging and depth profiling with a wide mass range, high lateral resolution, and good sensitivity. Almost all types of solid materials, even non-conductive ones, can be analyzed without elaborate sample … WebIV instrument (IONTOF) using 25 ‐kV Bi1+ primary ions. The analyses were conducted at a pressure of 10 −9 mbar in the spectrometry mode of the instrument (i.e., high ‐current bunched mode) with a field of view of 100×100µm 2.Ele-mental and molecular information from the analyzed sample surface were acquired by setting the detector in the chrysal symptoms
Efficient and sample‐specific interpretation of ToF‐SIMS data by ...
Web25 mei 2024 · Innovative Ion Beam Technology for Surface Analysis IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines … WebExtremely surface sensitive instrument, providing unique and quantitative characterization of the top atomic layer. External link Qtac Product Software SurfaceLab 7 Versatile … WebSurfaceLab 7 Version 7.3 Pre-Release 1 and SurfaceLab 7 Version 7.2 Bugfixing Release 4 have just been released and are available for our customers from our ... IONTOF GmbH 628 followers chrysal tablets